Volume 11, Issue 2 (November 2012)                   JIRSS 2012, 11(2): 191-202 | Back to browse issues page

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Abstract:   (7205 Views)
In this paper, we introduce a goodness of fit test for expo- nentiality based on Lin-Wong divergence measure. In order to estimate the divergence, we use a method similar to Vasicek’s method for estimat- ing the Shannon entropy. The critical values and the powers of the test are computed by Monte Carlo simulation. It is shown that the proposed test are competitive with other tests of exponentiality based on entropy.
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Subject: 60: Probability theory and stochastic processes
Received: 2012/10/11 | Accepted: 2015/09/12