Volume 11, Issue 2 (November 2012)                   JIRSS 2012, 11(2): 191-202 | Back to browse issues page

XML Persian Abstract Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Abbasnejad M, Arghami N R, Tavakoli M. A Goodness of Fit Test For Exponentiality Based on Lin-Wong Information. JIRSS. 2012; 11 (2) :191-202
URL: http://jirss.irstat.ir/article-1-192-en.html
Abstract:   (6301 Views)
In this paper, we introduce a goodness of fit test for expo- nentiality based on Lin-Wong divergence measure. In order to estimate the divergence, we use a method similar to Vasicek’s method for estimat- ing the Shannon entropy. The critical values and the powers of the test are computed by Monte Carlo simulation. It is shown that the proposed test are competitive with other tests of exponentiality based on entropy.
Full-Text [PDF 86 kb]   (2441 Downloads)    
Subject: 60: Probability theory and stochastic processes
Received: 2012/10/11 | Accepted: 2015/09/12

Add your comments about this article : Your username or Email:
Write the security code in the box

© 2015 All Rights Reserved | Journal of The Iranian Statistical Society